Electrical connector system

ABSTRACT

High-speed backplane connectors systems for mounting a substrate that are capable of operating at speeds of up to at least 25 Gbps, while in some implementations also providing pin densities of at least 50 pairs of electrical connectors per inch are disclosed. Implementations of the high-speed connector systems may provide ground shields and/or other ground structures that substantially encapsulate electrical connector pairs, which may be differential electrical connector pairs, in a three-dimensional manner throughout a backplane footprint, a backplane connector, and a daughtercard footprint. These encapsulating ground shields and/or ground structures prevent undesirable propagation of non-traverse, longitudinal, and higher-order modes when the high-speed backplane connector systems operates at frequencies up to at least 30 GHz.

RELATED APPLICATIONS

The present application claims priority to U.S. Provisional PatentApplication No. 61/200,955, filed Dec. 5, 2008, and U.S. ProvisionalPatent Application No. 61/205,194, filed Jan. 16, 2009, the entirety ofeach of which are hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,568, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,587, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,545, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,505, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,772, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,626, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

The present application is related to U.S. patent application Ser. No.12/474,674, titled “Electrical Connector System,” filed May 29, 2009,the entirety of which is hereby incorporated by reference.

BACKGROUND

As shown in FIG. 1, backplane connector systems are typically used toconnect a first substrate 2, such as a printed circuit board, inparallel (perpendicular) with a second substrate 3, such as anotherprinted circuit board. As the size of electronic components is reducedand electronic components generally become more complex, it is oftendesirable to fit more components in less space on a circuit board orother substrate. Consequently, it has become desirable to reduce thespacing between electrical terminals within backplane connector systemsand to increase the number of electrical terminals housed withinbackplane connector systems. Accordingly, it is desirable to developbackplane connector systems capable of operating at increased speeds,while also increasing the number of electrical terminals housed withinthe backplane connector system.

SUMMARY OF THE INVENTION

The high-speed backplane connector systems described below address thesedesires by providing electrical connector systems for mounting asubstrate that are capable of operating at speeds of up to at least 25Gbps.

In one aspect, an electrical connector system for mounting a substrateis disclosed. The system comprises a plurality of wafer assembliesdefining a mating end and a mounting end, and a wafer housing adapted toposition the plurality of wafer assemblies adjacent to one another inthe electrical connector system. Each wafer assembly comprises a firsthousing, a first array of electrical contacts, a second housing, asecond array of electrical contacts, and a ground frame.

The first housing defines a plurality of first electrical contactchannels. The first array of electrical contacts is positionedsubstantially within the plurality of first electrical contact channels,where each electrical contact of the first array of electrical contactsdefines an electrical mating connector extending past an edge of thefirst housing at the mating end of the wafer assembly.

The second housing is configured to mate with the first housing anddefines a plurality of second electrical contact channels. The secondarray of electrical contacts is positioned substantially within theplurality of second electrical contact channels, where each electricalcontact of the second array of electrical contacts defines an electricalmating connector extending past an edge of the second housing at themating end of the wafer assembly.

The ground frame is positioned at a side of the second housing, theground frame defining a plurality of ground mating tabs extending pastthe edge of the second housing at the mating end of the wafer assembly.

In another aspect, a wafer assembly is disclosed. The wafer assemblycomprises a first housing, a first array of electrical contacts, a firstinsulating overmold, a second housing, a second array of electricalcontacts, a second insulating overmold, and a ground frame.

The first housing defines a plurality of first electrical contactchannels. The first array of electrical contacts is positionedsubstantially within the plurality of first electrical contact channels,where each electrical contact of the first array of electrical contactsdefines an electrical mating connector extending past an edge of thefirst housing at a mating end of the wafer assembly. The firstinsulating overmold partially surrounds the first array of electricalcontacts and is positioned substantially within the plurality of firstelectrical contact channels.

The second housing is configured to mate with the first housing anddefines a plurality of second electrical contact channels. The secondarray of electrical contacts is positioned substantially within theplurality of second electrical contact channels, where each electricalcontact of the second array of electrical contacts defines an electricalmating connector extending past an edge of the second housing at themating end of the wafer assembly. The second insulating overmoldpartially surrounds the second array of electrical contacts, where thesecond insulating overmold is positioned substantially within theplurality of second electrical contact channels.

The ground frame is positioned at a side of the second housing anddefines a plurality of ground mating tabs extending past the edge of thesecond housing at the mating end of the wafer assembly.

In yet another aspect, a wafer assembly is disclosed. The wafer assemblycomprises a first housing, a first array of electrical contacts, asecond housing, and a second array of electrical contacts. The firsthousing defines a plurality of first electrical contact channels, afirst plurality of mating ridges, and a first plurality of matingrecesses, where at least one mating ridge of the first plurality ofmating ridges and at least one mating recess of the first plurality ofmating recesses are positioned between two adjacent electrical contactchannels of the plurality of first electrical contact channels. Thefirst array of electrical contacts is positioned substantially withinthe plurality of first electrical contact channels.

The second housing is configured to mate with the first housing anddefines a plurality of second electrical contact channels, a secondplurality of mating ridges, and a second plurality of mating recesses,where at least one mating ridge of the second plurality of mating ridgesand at least one mating recess of the second plurality of matingrecesses are positioned between two adjacent electrical contact channelsof the plurality of second electrical contact channels. The second arrayof electrical contacts is positioned substantially within the pluralityof second electrical contact channels.

When the second housing mates with the first housing, the firstplurality of mating ridges engage and mate with the second plurality ofmating recesses and the second plurality of mating ridges engage andmate with the first plurality of mating recesses.

In another aspect an electrical connector system for mounting asubstrate is disclosed. Each wafer assembly is positioned adjacent toanother wafer assembly in the electrical connector system. Each waferassembly comprises a first housing, a first array of electricalcontacts, a second housing, and a second array of electrical contacts.

The first housing defines a plurality of first electrical contactchannels and the first array of electrical contacts is positionedsubstantially within the plurality of first electrical contact channels.The second housing is configured to mate with the first housing anddefines a plurality of second electrical contact channels. The secondarray of electrical contacts is positioned substantially within theplurality of second electrical contact channels. When the first housingmates with the second housing, the first and second housings define aplurality of air gaps, where at least one of the air gaps of theplurality of air gaps electrically isolates an electrical contact of thefirst array of electrical contacts and an electrical contact of thesecond array of electrical contacts.

The plurality of wafer assemblies are sized and positioned in theelectrical connector system to provide a substantially uniform impedanceprofile to electrical signals carried on the electrical contacts of thefirst and second arrays of electrical contacts of the plurality of waferassemblies at speeds of up to at least 25 Gbps, where a density ofelectrical contacts at a mating end of the plurality of wafer assembliesis greater than 100 contacts per square inch.

In yet another aspect an electrical connector system for mounting asubstrate is disclosed. The system comprises a plurality of waferassemblies and a wafer housing that positions the plurality of waferassemblies such that the wafer assemblies are aligned and positionedadjacent to one another in the electrical connector system.

Each wafer assembly comprises a first housing, a first array ofelectrical contacts, a second housing, and a second array of electricalcontacts. The first housing defines a plurality of first electricalcontact channels and the first array of electrical contacts ispositioned substantially within the plurality of first electricalcontact channels. The second housing is configured to mate with thefirst housing and defines a plurality of second electrical contactchannels. The second array of electrical contacts is positionedsubstantially within the plurality of second electrical contactchannels.

The wafer housing defines an air gap between a mating face of the waferhousing and the first and second housings such that the air gapsurrounds at least a mating end of first and second arrays of electricalcontacts.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram of a backplane connector system connecting a firstsubstrate to a second substrate.

FIG. 2 is a perspective view of a portion of a high-speed backplaneconnector system.

FIG. 3 is a partially exploded view of the high-speed backplaneconnector system of FIG. 2.

FIG. 4 is a perspective view of a wafer assembly.

FIG. 5 is a partially exploded view of the wafer assembly of FIG. 4.

FIG. 6 a is a perspective view of a center frame of a wafer assembly.

FIG. 6 b is another perspective view of a center frame of a waferassembly.

FIG. 7 a is a partially exploded view of the wafer assembly of FIG. 4.

FIG. 7 b is a cross-sectional view of a center frame.

FIG. 8 illustrates a closed-band electrical mating connector.

FIG. 9 a illustrates a tri-beam electrical mating connector.

FIG. 9 b illustrates a dual-beam electrical mating connector.

FIG. 9 c illustrates additional implementations of electrical matingconnectors.

FIG. 9 d illustrates a mirrored pair of electrical mating connectors.

FIG. 9 e illustrates a plurality of mirrored pairs of electrical matingconnectors.

FIG. 10 illustrates a plurality of ground tabs.

FIG. 11 is a perspective view of a ground tab.

FIG. 12 is another perspective view of a wafer assembly.

FIG. 13 illustrates an organizer.

FIG. 14 is a perspective view of a wafer housing.

FIG. 15 is an additional perspective view of a wafer housing.

FIG. 16 is a cross-sectional view of a plurality of wafer assemblies.

FIG. 17 a is a side view of a center frame that includes a plurality ofmating ridges and a plurality of mating recesses.

FIG. 17 b is a cross-sectional view of a plurality of wafer assembliesthat include a plurality of mating ridges and a plurality of matingrecesses.

FIG. 18 a is a perspective view of a header unit.

FIG. 18 b illustrates one implementation a mating face of a header unit.

FIG. 18 c illustrates another implementation of a mating face of aheader unit.

FIG. 18 d illustrates a pair of signal pins substantially surrounded bya C-shaped ground shield and a ground tab.

FIG. 19 a illustrates one implementation of a signal pin of a headerunit.

FIG. 19 b illustrates another implementation of a signal pin of a headerunit.

FIG. 19 c illustrates yet another implementation of a signal pin of aheader unit.

FIG. 19 d illustrates a mirrored pair of signal pins of a header unit.

FIG. 20 a is a perspective view of a C-shaped ground shield of a headerunit.

FIG. 20 b is another view of the C-shaped ground shield of FIG. 20 a ofa header unit.

FIG. 20 c illustrates another implementation of a C-shaped ground shieldof a header unit.

FIG. 20 d illustrates yet another implementation of a C-shaped groundshield of a header unit.

FIG. 20 e illustrates another implementation of a C-shaped ground shieldof a header unit.

FIG. 21 illustrates one implementation of a ground tab of a header unit.

FIG. 22 is a perspective view of a high-speed backplane connectorsystem.

FIG. 23 is another perspective view of the high-speed backplaneconnector system of FIG. 22.

FIG. 24 is yet another perspective view of the high-speed backplaneconnector system of FIG. 22.

FIG. 25 illustrates one implementation of a mounting face of a headerunit.

FIG. 26 a illustrates a noise-cancelling footprint of one implementationof a high-speed backplane connector system.

FIG. 26 b is an enlarged view of a portion of the noise-cancellingfootprint of FIG. 26 a.

FIG. 27 a illustrates another implementation of a mounting face of aheader unit.

FIG. 27 b illustrates a noise-cancelling footprint of the mounting faceof the header unit of FIG. 27 a.

FIG. 27 c illustrates yet another implementation of a mounting face of aheader unit.

FIG. 27 d illustrates a noise-cancelling array of the mounting face ofthe header unit of FIG. 27 c.

FIG. 28 a illustrates a substrate footprint that may be used withhigh-speed backplane connector systems.

FIG. 28 b illustrates an enlarged view of the substrate footprint ofFIG. 28 a.

FIG. 28 c illustrates a substrate footprint that may be used withhigh-speed backplane connector systems.

FIG. 28 d illustrates an enlarged view of the substrate footprint ofFIG. 28 c.

FIG. 29 a illustrates a header unit including a guidance post and amating key.

FIG. 29 b illustrates a wafer housing for use with the header unit ofFIG. 28 a.

FIG. 30 a illustrates a mounting end of a plurality of wafer assemblies.

FIG. 30 b is an enlarged view of a portion of a noise-cancellingfootprint of the mounting end of the plurality of wafer assembliesillustrates in FIG. 29 a.

FIG. 31 a is a perspective view of a tie bar.

FIG. 31 b illustrates a tie bar engaging a plurality of waferassemblies.

FIG. 32 a is a performance plot illustrating insertion loss vs.frequency for the high-speed backplane connector system of FIG. 2.

FIG. 32 b is a performance plot illustrating return loss vs. frequencyfor the high-speed backplane connector system of FIG. 2.

FIG. 32 c is a performance plot illustrating near-end crosstalk noisevs. frequency for the high-speed backplane connector system of FIG. 2.

FIG. 32 d is a performance plot illustrating far-end crosstalk noise vs.frequency for the high-speed connector system of FIG. 2.

FIG. 33 is a perspective view of another implementation of a high-speedbackplane connector system.

FIG. 34 is an exploded view of a wafer assembly.

FIG. 35 a is a front perspective view of a center frame.

FIG. 35 b is a side view of a center frame.

FIG. 35 c is a rear perspective view of a center frame.

FIG. 36 illustrates front and side views of a wafer assembly.

FIG. 37 a is a front view of a wafer housing.

FIG. 37 b is a rear view of a wafer housing.

FIG. 38 is a cross-sectional view of a plurality of wafer assemblies.

FIG. 39 a illustrates an unmated header unit, wafer housing, andplurality of wafer assemblies.

FIG. 39 b illustrates a mated header unit, wafer housing, and pluralityof wafer assemblies.

FIG. 39 c illustrates a rear perspective view of an unmated header unit,wafer housing, and plurality of wafer assemblies.

FIG. 39 d illustrates an enlarged rear perspective view of an unmatedheader unit, wafer housing, and plurality of wafer assemblies.

FIG. 40 a is a performance plot illustrating insertion loss vs.frequency for the high-speed backplane connector system of FIG. 33.

FIG. 40 b is a performance plot illustrating return loss vs. frequencyfor the high-speed backplane connector system of FIG. 33.

FIG. 40 c is a performance plot illustrating near-end crosstalk noisevs. frequency for the high-speed backplane connector system of FIG. 33.

FIG. 40 d is a performance plot illustrating far-end crosstalk noise vs.frequency for the high-speed connector system of FIG. 33.

FIG. 41 is a perspective view, and a partially exploded view, of anotherimplementation of a high-speed backplane connector.

FIG. 42 is another perspective view, and partially exploded view, of thehigh-speed backplane connector of FIG. 41.

FIG. 43 a is a perspective view of a wafer assembly.

FIG. 43 b is a partially exploded view of a wafer assembly.

FIG. 44 a is a perspective view of a housing and an embedded groundframe.

FIG. 44 b is a perspective view of a ground frame that may be positionedat a side of a housing.

FIG. 44 c is a perspective view of a wafer assembly with a ground framepositioned at a side of a housing.

FIG. 45 is a cross-sectional view of a wafer assembly.

FIG. 46 illustrates front and side views of a wafer assembly.

FIG. 47 a illustrates one implementation of a ground shield;

FIG. 47 b illustrates an assembled wafer assembly with a ground shieldspanning two electrical mating connectors and electrically commoned tothe first and second housings.

FIGS. 47 c and 47 d are additional illustrations of an assembled waferassembly with a ground shield spanning two electrical mating connectorsand electrically commoned to the first and second housings.

FIG. 48 a is a perspective view of a mating face of a header unit.

FIG. 48 b is a perspective view of a mating face of a wafer housing.

FIG. 49 illustrates an air gap between two adjacent wafer assemblies.

FIG. 50 a is a perspective view of an unmated high-speed backplaneconnector system.

FIG. 50 b is a perspective view of a mated high-speed backplaneconnector system.

FIG. 51 a is a perspective view of a plurality of wafer assemblies andan organizer.

FIG. 51 b is another perspective view of a plurality of wafer assembliesand an organizer.

FIG. 52 a is a perspective view of one implementation of a mounting-faceorganizer.

FIG. 52 b is an enlarged view of the mounting-face organizer of FIG. 52a positioned at a mounting face of a plurality of wafer assemblies.

FIG. 52 c is a perspective view of the high-speed backplane connector ofFIG. 41 with the mounting-face organizer of FIG. 52 a.

FIG. 53 a is a perspective view of another implementation of amounting-face organizer;

FIG. 53 b illustrates an air gap at a mounting end of a plurality ofwafer assemblies created by a plurality of projections extending throughthe mounting-face organizer of FIG. 53 a.

FIGS. 53 c and 53 d are additional illustrations of a plurality ofprojections extending through the mounting face organizer of FIG. 53 a.

FIG. 54 a is a performance plot illustrating insertion loss vs.frequency for the high-speed backplane connector system of FIG. 41.

FIG. 54 b is a performance plot illustrating return loss vs. frequencyfor the high-speed backplane connector system of FIG. 41.

FIG. 54 c is a performance plot illustrating near-end crosstalk noisevs. frequency for the high-speed backplane connector system of FIG. 41.

FIG. 54 d is a performance plot illustrating far-end crosstalk noise vs.frequency for the high-speed connector system of FIG. 41.

FIG. 55 is a perspective view of a portion of yet another implementationof a high-speed backplane connector system.

FIG. 56 a is a perspective view of a ground shield.

FIG. 56 b is a perspective view of a plurality of housing assemblies.

FIG. 56 c is another perspective view of the ground shield.

FIG. 57 a illustrates a plurality of unbent electrical contactassemblies.

FIG. 57 b illustrates a plurality of bent electrical contact assemblies.

FIG. 58 is an enlarged view of a differential pair of electrical matingconnectors.

FIG. 59 illustrates a noise-canceling footprint of a mounting end of aground shield and a matrix of electrical contact assemblies.

FIG. 60 is a front view of a mounting end organizer.

FIG. 61 a is a side view of a portion of a high-speed backplaneconnector system.

FIG. 61 b is a perspective view of a portion of a high-speed backplaneconnector system.

FIG. 62 illustrates a ground shield and plurality of wafer assembliesmating with a header unit.

FIG. 63 a is a performance plot illustrating insertion loss vs.frequency for the high-speed backplane connector system of FIG. 55.

FIG. 63 b is a performance plot illustrating return loss vs. frequencyfor the high-speed backplane connector system of FIG. 55.

FIG. 63 c is a performance plot illustrating near-end crosstalk noisevs. frequency for the high-speed backplane connector system of FIG. 55.

FIG. 63 d is a performance plot illustrating far-end crosstalk noise vs.frequency for the high-speed connector system of FIG. 55.

FIG. 64 is an illustration of a mating end of a plurality of waferassemblies.

FIG. 65 is another illustration of a mating end of a plurality of waferassemblies.

FIG. 66 a is a perspective view of a header assembly.

FIG. 66 b is a side view of the header assembly of FIG. 66 a.

FIG. 67 illustrates a mounting pin layout of the header assembly ofFIGS. 66 a and 66 b.

FIG. 68 is an illustration of a mating end of one implementations of aplurality of wafer assemblies.

FIG. 69 is an illustration of a mating end of another implementation ofa plurality of wafer assemblies.

FIG. 70 is an illustration of a mating end of yet another implementationof a plurality of wafer assemblies.

FIG. 71 a is a performance plot illustrating insertion loss vs.frequency for a high-speed backplane connector system including thewafer assembly design of FIGS. 66-70.

FIG. 71 b is a performance plot illustrating return loss vs. frequencyfor the high-speed backplane connector system including the waferassembly design of FIGS. 66-70.

FIG. 71 c is a performance plot illustrating near-end crosstalk noisevs. frequency for the high-speed backplane connector system includingthe wafer assembly design of FIGS. 66-70.

FIG. 71 d is a performance plot illustrating far-end crosstalk noise vs.frequency for the high-speed connector system including the waferassembly design of FIGS. 66-70.

DETAILED DESCRIPTION

The present disclosure is directed to high-speed backplane connectorssystems for mounting a substrate that are capable of operating at speedsof up to at least 25 Gbps, while in some implementations also providingpin densities of at least 50 pairs of electrical connectors per inch. Aswill be explained in more detail below, implementations of the disclosedhigh-speed connector systems may provide ground shields and/or groundstructures that substantially encapsulate electrical connector pairs,which may be differential electrical connector pairs, in athree-dimensional manner throughout a backplane footprint, a backplaneconnector, and a daughtercard footprint. These encapsulating groundshields and/or ground structures, along with a dielectric filler of thedifferential cavities surrounding the electrical connector pairsthemselves, prevent undesirable propagation of non-traverse,longitudinal, and higher-order modes when the high-speed backplaneconnector systems operates at frequencies up to at least 30 GHz.

Further, as explained in more detail below, implementations of thedisclosed high-speed connector systems may provide substantiallyidentical geometry between each connector of an electrical connectorpair to prevent longitudinal moding.

A first high-speed backplane connector system 100 is described withrespect to FIGS. 2-32. The high-speed backplane connector 100 includes aplurality of wafer assemblies 102 that, as explained in more detailbelow, are positioned adjacent to one another within the connectorsystem 100 by a wafer housing 104.

Each wafer assembly 106 of the plurality of wafer assemblies 102includes a center frame 108, a first array of electrical contacts 110(also known as a first lead frame assembly), a second array ofelectrical contacts 112 (also known as a second lead frame assembly), aplurality of ground tabs 132, and an organizer 134. In someimplementations, the center frame 108 comprises a plated plastic ordiecast ground wafer such as tin (Sn) over nickel (Ni) plated or a zinc(Zn) die cast, and the first and second arrays of electrical contacts110, 112 comprise phosphor bronze and gold (Au) or tin (Sn) over nickel(Ni) plating. However, in other implementations, the center frame 108may comprise an aluminum (Al) die cast, a conductive polymer, a metalinjection molding, or any other type of metal; the first and secondarrays of electrical contacts 110, 112 may comprise any copper (Cu)alloy material; and the platings could be any noble metal such as Pd oran alloy such as Pd—Ni or Au flashed Pd in the contact area, tin (Sn) ornickel (Ni) in the mounting area, and nickel (Ni) in the underplating orbase plating.

The center frame 108 defines a first side 114 and a second side 116opposing the first side 114. The first side 114 comprises a conductivesurface that defines a plurality of first channels 118. In someimplementations, each channel of the plurality of first channels 118 islined with an insulation layer 119, such as an overmolded plasticdielectric, so that when the first array of electrical contacts 110 ispositioned substantially within the plurality of first channels 118, theinsulation layer 119 electrically isolates the electrical contacts fromthe conductive surface of the first side 114.

Similarly, the second side 116 also comprises a conductive surface thatdefines a plurality of second channels 120. As with the plurality offirst channels 118, in some implementations, each channel of theplurality of second channels 120 is lined with an insulation layer 121,such as an overmolded plastic dielectric, so that when the second arrayof electrical contacts 112 is positioned substantially within theplurality of second channels 120, the insulation layer 121 electricallyisolates the electrical contacts from the conductive surface of thesecond side 116.

As shown in FIG. 7 b, in some implementations, the center frame includesan embedded conductive shield 115 positioned between the first andsecond sides 114, 116. The conductive shield 115 is electricallyconnected to the conductive surfaces of the first side 114 and theconductive surface of the second side 116.

Referring to FIG. 4, when assembled, the first array of electricalcontacts 110 is positioned substantially within the plurality ofchannels 118 of the first side 114 of the center frame 108 and thesecond array of electrical contacts 112 is positioned substantiallywithin the plurality of channels 120 of the second side 116 of thecenter frame 108. When positioned within the plurality of channels 118,120, each electrical contact of the first array of electrical contacts110 is positioned adjacent to an electrical contact of the second arrayof electrical contacts 112. In some implementations, the first andsecond arrays of electrical contacts 110, 112 are positioned in theplurality of channels 118, 120 such that a distance between adjacentelectrical contacts is substantially the same throughout the waferassembly 106. Together, the adjacent electrical contacts of the firstand second arrays of electrical contacts 110, 112 form an electricalcontact pair 130. In some implementations, the electrical contact pair130 may be a differential pair of electrical contacts.

When positioned within the plurality of channels 118, 120, electricalmating connectors 129 of the first and second array of electricalcontacts 110, 112 extend away from a mating end 131 of the waferassembly 106. In some implementations, the electrical mating connectors129 are closed-band shaped as shown in FIGS. 7 a and 8, where in otherimplementations, the electrical mating connectors 129 are tri-beamshaped as shown in FIG. 9 a or dual-beam shaped as shown in FIG. 9 b.Other mating connector styles could have a multiplicity of beams.Examples of yet other implementations of electrical mating connectors129 are shown in FIG. 9 c.

It will be appreciated that the tri-beam shaped, dual-beam shaped, orclosed-band shaped electrical mating connectors 129 provide improvedreliability in a dusty environment; provide improved performance in anon-stable environment, such as an environment with vibration orphysical shock; result in lower contact resistance due to parallelelectrical paths; and the closed-band or tri-beam shaped arrangementsprovide improved electromagnetic properties due to the fact energy tendsto radiate from sharp corners of electrical mating connectors 129 with aboxier geometry.

Referring to FIGS. 9 d and 9 e, in some implementations, for eachelectrical contact pair 130, the electrical contact of the first arrayof electrical contacts 110 mirrors the adjacent electrical contact ofthe second array of electrical contacts 112. It will be appreciated thatmirroring the electrical contacts of the electrical contact pairprovides advantages in manufacturing as well as column-to-columnconsistency for high-speed electrical performance, while still providinga unique structure in pairs of two columns.

When positioned within the plurality of channels 118, 120, substrateengagement elements 172, such as electrical contact mounting pins, ofthe first and second array of electrical contacts 110, 112 also extendaway from a mounting end 170 of the wafer assembly 106.

The first array of electrical contacts 110 includes a first spacer 122and a second spacer 124 to space each electrical contact appropriatelyfor insertion substantially within the plurality of first channels 118.Similarly, the second array of electrical contacts 112 includes a firstspacer 126 and a second spacer 128 to space each electrical contactappropriately for insertion within the plurality of second channels 120.In some implementations, the first and second spacers 122, 124 of thefirst array of electrical contacts 110 and the first and second spacers126, 128 of the second array of electrical contacts 112 comprise moldedplastic. The first and second arrays of electrical contacts 110, 112 aresubstantially positioned within the plurality of channels 118, 120, thefirst spacer 122 of the first array of electrical contacts 110 abuts thefirst spacer 126 of the second array of electrical contacts 112.

In some implementations the first spacer 122 of the first array ofelectrical contacts 110 may define a tooth-shaped side, or a wave-shapedside, and the first spacer 126 of the second array of electricalcontacts may define a complementary tooth-shaped side, or acomplementary wave-shaped side, so that when the first spacers 122, 126abut, the complementary sides of the first spacers 122, 126 engage andmate.

As shown in FIGS. 4, 10, and 11, the plurality of ground tabs 132 ispositioned at the mating end 131 of the wafer assembly 106 to extendaway from the center frame 108. The ground tabs 132 are electricallyconnected to at least one of the first and second sides 114, 116 of thecentral frame 108. Typically, a ground tab 132 is paddle shaped and atleast one ground tab 132 is positioned above and below each electricalcontact pair 130 at the mating end 131 of the wafer assembly. In someimplementations, the ground tabs comprise tin (Sn) over nickel (Ni)plated brass or other electrically conductive platings or base metals.

The organizer 134 is positioned at the mating end 131 of the waferassembly 106. The organizer comprises a plurality of apertures 135 thatallow the electrical mating connectors 129 and ground tabs 132 extendingfrom the wafer assembly 106 to pass through the organizer 134 when theorganizer 134 is positioned at the mating end 131 of the wafer assembly106. The organizer serves to securely lock the center frame 108, firstarray of electrical contacts 110, second array of electrical contacts112, and ground tabs 132 together.

Referring to FIGS. 2 and 3, the wafer housing 104 engages the pluralityof wafer assemblies 102 at the mating end 131 of each wafer assembly106. The wafer housing 104 accepts the electrical mating connectors 129and ground tabs 132 extending from the plurality of wafer assemblies102, and positions each wafer assembly 106 adjacent to another waferassembly 106 of the plurality of wafer assemblies 102. As shown in FIG.16, when positioned adjacent to one another, two wafer assemblies 106define a plurality of air gaps 134 substantially between a length of anelectrical contact of a first wafer assembly 106 and a length of anelectrical contact of a second wafer assembly 106. Each air gap 134serves to electrically isolate the electrical contacts positioned withthe air gap 134 of the wafer assemblies 106.

Referring to FIGS. 17 a and 17 b, in some implementations, each centerframe 108 defines a plurality of mating ridges 109 extending from thefirst side 114 of the center frame 108 and a plurality of mating ridges109 extending from the second side 116 of the center frame 108.Additionally, each center frame defines a plurality of mating recesses111 at the first side 114 of the center frame 108 and a plurality ofmating recesses 111 at the second side 116 of the center frame 108.

As shown in FIG. 17 a, in some implementations, one of the mating ridges109 and one of the mating recesses 111 are positioned between eachchannel of the plurality of second channels 120 on the second side 116of the center frame 108. Further, mating ridges 109 and mating recesses111 are positioned between each channel of the plurality of firstchannels 118 on the first side 114 of the center frame 108 thatcomplement the mating ridges 109 and mating recesses 111 on the secondside. Therefore, as shown in FIG. 17 b, when two wafer assemblies 106are positioned adjacent to each other in the wafer housing 104, themating ridges 109 extending from the first side 114 of a first waferassembly 106 engage the mating recesses 111 positioned on the secondside 116 of the second adjacent wafer assembly 106, and the matingridges 109 extending from the second side 116 of the second waferassembly 106 engage the mating recesses 111 positioned on the first side114 of the adjacent first wafer assembly 106.

The resulting overlap 113 provides for improved contact between adjacentwafer assemblies 106. Additionally, the resulting overlap 113 disrupts adirect signal path between adjacent air gaps 134, thereby improving theperformance of signals traveling on the electrical contacts of the firstand second arrays of electrical contacts 110, 112 positioned in the airgaps 134.

As shown in FIGS. 18-23, the connector system 100 further includes aheader module 136 adapted to mate with the wafer housing 104. A matingface of the header module 136 that engages the wafer housing 104includes a plurality of C-shaped ground shields 138, a row of groundtabs 140, and a plurality of signal pin pairs 142. In someimplementations, the header module 136 may comprise a liquid crystalpolymer (LCP) insulator; the signal pin pairs 142 comprise phosphorbronze base material and, gold (Au), and tin (Sn) platings over nickel(Ni) plating; and the ground shields 138 and ground tabs 140 comprisebrass base material with tin (Sn) over nickel (Ni) plating. Otherelectrically conductive base materials and platings (noble or non-noble)can be used to construct signal pins, ground shields, and ground tabs.Other polymers can be used to construct housings.

As shown in FIGS. 18 a and 18 b, the row of ground tabs 140 ispositioned along one side of the mating face of the header module 136. Afirst row 144 of the plurality of C-shaped ground shields 138 ispositioned above the row of ground tabs 140 at an open end of theC-shaped ground shields 138 so that a signal pin pair 146 of theplurality of signal pin pairs 142 is substantially surrounded by aground tab and a C-shaped ground shield.

A second row 148 of the plurality of C-shaped ground shields 138 ispositioned above the first row 144 of the plurality of C-shaped groundshields 138 at an open end of C-shaped ground shields of the second row148 so that a signal pin pair 150 of the plurality of signal pin pairs142 is substantially surrounded by an edge of a C-shaped ground shieldof the first row 144 and a C-shaped ground shield of the second row 148.It will be appreciated that this pattern is repeated so that eachsubsequent signal pin pair 142 is substantially surrounded by an edge ofa first C-shaped ground shield and a second C-shaped ground shield.

The row of ground tabs 140 and plurality of C-shaped ground shields 138are positioned on the header module 136 such that when the header module136 mates with the plurality of wafer assemblies 102 and wafer housing,as described in more detail below, each C-shaped ground shield ishorizontal and perpendicular to a wafer assembly 106, and spans both anelectrical contact of the first array of electrical contacts 110 and anelectrical contact of the second array of electrical contacts of thewafer assembly 106.

As shown in FIG. 18 d, each signal pin pair 142 is positioned on theheader module 136 such that a distance between a first signal pin 143 ofthe signal pin pair and a point on a C-shaped ground shield or groundtab (See distances a, b, and c) is substantially equal to a distancebetween a second signal pin 145 of the signal pin pair and acorresponding point on the C-shaped ground shield or ground tab (Seedistances a′, b′, and c′). This symmetry between the first and secondsignal pins 143, 145 and the C-shaped ground shield or ground tabprovides improved manageability of signals traveling on the signal pinpair 142.

In some implementations, each signal pin of the plurality of signal pinpairs 142 is a vertical rounded pin as shown in FIG. 19 a so that as theheader module 136 receives the wafer housing 104, the wafer housing 104receives the plurality of signal pin pairs 142, and the plurality ofsignal pin pairs 142 are received by, and engage the electrical matingconnectors 129 of the first and second arrays of electrical contacts110, 112 that are extending from the plurality of wafer assemblies 102.However, in other implementations, each signal pin of the plurality ofsignal pin pairs 142 is a vertical U-shaped pin as shown in FIG. 19 b orFIG. 19 c. It will be appreciated that the U-shaped pin provides forefficient manufacturing because dual gage material is not required tomake a mating end and a mounting end.

Referring to FIGS. 19 d, in some implementations, for each signal pinpair 142, the first signal pin 143 of the signal pin pair mirrors theadjacent second signal pin 145 of the signal pin pair. It will beappreciated that mirroring the signal pins of the signal pin pair 142provides advantages in manufacturing as well in high-speed electricalperformance, while still providing a unique structure for the signal pinpairs.

In some implementations, each C-shaped ground shield 138 and each groundtab 140 of the header module 136 may include one or more matinginterfaces 152 as shown in FIGS. 20 a, 20 b, 20 c, 20 d, 20 e, and 21.Accordingly, as the header module 136 receives the wafer housing 104 asshown in FIGS. 22-24, the wafer housing 104 receives the ground shields138 and ground tabs 140 of the header module 136, and the C-shapedground shields 138 and ground tabs 140 of the header module 136 engagethe ground tabs 132 extending from the plurality of wafer assemblies 102at at least the one or more mating interfaces 152.

It will be appreciated that when the header module 136 mates with thewafer housing 104 and plurality of wafer assemblies 102, each set ofengaged signal pin pair 142 and electrical mating connectors 129 of thefirst and second arrays of electrical contacts 110, 112 is substantiallysurrounded by, and electrically isolated by, a ground tab 132 of a waferassembly 106, a C-shaped ground shield 136 of the header module 136 andone of a ground tab 140 of the header module 136 or a side of anotherC-shaped ground shield 136 of the header module 136.

As shown in FIGS. 19-21, each C-shaped ground shield and ground tab ofthe header module 136 additionally defines one or more substrateengagement elements 156, such as a ground mounting pin, each of which isconfigured to engage a substrate at a via of the substrate. Further,each signal pin of the header module 136 additionally defines asubstrate engagement element 158, such as a signal mounting pin, that isconfigured to engage a substrate at a via of the substrate. In someimplementations, each ground mounting pin 156 and signal mounting pin158 defines a broadside 161 and an edge 163 that is smaller than thebroadside 161.

The ground mounting pins 156 and signal mounting pins 158 extend throughthe header module 136, and extend away from a mounting face of theheader module 136. The ground mounting pins 156 and signal mounting pins158 are used to engage a substrate such as a backplane circuit board ora daughtercard circuit board.

In some implementations, each pair of signal mounting pins 158 ispositioned in one of two orientations, such as broadside coupled or edgecoupled. In other implementations, each pair of signal mounting pins 156is positioned in one of two orientations where in a first orientation, apair of signal mounting pins 158 are aligned so that the broadsides 161of the pair are substantially parallel to a substrate, and in a secondorientation, a pair of signal mounting pins 158 are aligned so that thebroadsides 161 of the pair are substantially perpendicular to thesubstrate. As discussed above with respect to FIGS. 9 d and 9 e, thesignal pins of a pair of signal mounting pins 158 may be positioned onthe header module 136 such that one signal pin of the pair of signalmounting pins 158 mirrors the adjacent signal pin of the pair of signalmounting pins 158.

In some implementations, the ground mounting pins 156 and signalmounting pins 158 may be positioned on the header module 136 as shown inFIGS. 25, 26 a and 26 b to create a noise-canceling footprint 159.Referring to FIG. 26 b, in the noise-canceling footprint 159, anorientation of a pair of signal mounting pins 160 is offset from anorientation of each adjacent pair of signal mounting pins 162 that isnot separated from signal mounting pins 160 by a ground mounting pin163. For example, the orientation of a pair of signal mounting pins 160may be offset by 90 degrees from the orientation of each pair of signalmounting pins 162 that is not separated from the pair of signal mountingpins 160 by a ground mounting pin 163.

In other implementations of footprints, as shown in FIGS. 27 a and 27 b,each pair of signal mounting pins 158 is positioned in the sameorientation. C-shaped ground shields 138 and ground tabs 140 withmultiple ground mounting pins 156 are then positioned around the signalpin pairs 142 as described above. The ground mounting pins 156 of theC-shaped ground shields 138 and ground tabs 140 are positioned such thatat least one ground mounting pin 156 is positioned between a signalmounting pin 158 of a first signal pin pair 142 and a signal mountingpin 158 of adjacent signal pin pairs 142. In some implementations, inaddition to the ground mounting pins illustrated in FIG. 27 a and FIG.27 b, the C-shaped ground shields 138 and ground tabs 140 may includeground mounting pins 156 positioned at locations 157.

In yet other implementations of footprints, as shown in FIGS. 27 c and27 d, each pair of signal mounting pins 158 is positioned in the sameorientation. C-shaped ground shields 138 and ground tabs 140 withmultiple ground mounting pins 156 are then positioned around the signalpin pairs 142 as described above. The ground mounting pins 156 arepositioned such that at least one ground mounting pin 156 is positionedbetween a signal mounting pin 158 of a first signal pin pair 142 and asignal mounting pin 158 of adjacent signal pin pairs 142.

It will be appreciated that positioning ground mounting pins 156 betweenthe signal mounting pins 158 reduces an amount of crosstalk between thesignal mounting pins 158. Crosstalk occurs when a signal traveling alonga signal pin of a signal pin pair 142 interferes with a signal travelingalong a signal pin of another signal pin pair 142.

With respect to the footprints described above, typically, the signalmounting pins 158 of the header module 136 engage a substrate at aplurality of first vias positioned on the substrate, wherein theplurality of first vias are arranged in a matrix of rows and columns andable to provide mounting of the electrical connector. Each first via isassociated with one of its closest neighboring first vias to form a pairof first vias. The pair of first vias is configured to receive signalmounting pins 158 of one of the signal pin pairs 142. The groundmounting pins 156 of the C-shaped ground shields 138 and ground tabs 140of the header module 136 engage a substrate at a plurality of secondvias positioned on the substrate. The plurality of second vias areconfigured to be electrically commoned to one another to provide acommon ground, and are positioned amongst the plurality of first viassuch that there is at least one second via positioned directly betweeneach first via and any of the closest non-paired first via neighbors.

Examples of substrate footprints that may receive the mounting end ofheader module 156, or as explained in more detail below the mounting endof the plurality of wafer assemblies 102, are illustrated in FIGS. 28 a,28 b, 28 c, and 28 d. It will be appreciated that substrate footprintsshould be able to maintain an impedance of a system, such as 100 Ohmsdifferentially, while also minimizing pair-to-pair crosstalk noise.Substrate footprints should also provide adequate routing channels fordifferential pairs while preserving skew-free routing and connectordesign. These tasks should be completed for substrate footprints thatare highly dense while minding substrate aspect ratio limits where viasmust be large enough (given a substrate thickness) in order to ensurereliable manufacturing.

One implementation of an optimized in-row-differential substratefootprint that may accomplish these tasks is illustrated in FIGS. 28 aand 28 b. This substrate footprint is oriented “in-row” so as to reduceor eliminate routing skew and connector skew. Further, the substratefootprint provides improved performance by providing multiple points ofcontact 165 for connector grounds shields to the printed circuit boardaround points of contact 167 for signal pins or electrical contacts.Additionally, the substrate footprint provides the ability to route alldifferential pairs out of an 8-row footprint in only four layers whileminimizing intra-layer, inter-layer, and trace-to-barrel routing noise.

The substrate footprint minimizes pair-to-pair crosstalk in that thetotal synchronous, multi-aggressor, worst-case crosstalk from a 20 ps(20-80%) edge is approximately 1.90% (far end noise). Further, thefootprint is arranged such that a majority of the far end noise comesfrom “in-row” aggressors, meaning that schemes such as arrayedtransmit/receiver pinouts and layer-specific routing can reduce thenoise of the footprint to less than 0.50%. In some implementations, at52.1 pairs of vias per inch, the substrate footprint provides an 8-rowfootprint with an impedance of over 80 Ohms, thereby providingdifferential insertion loss magnitude preservation in a 100 Ohm nominalsystem environment. In this implementation, an 18 mil diameter drill maybe used to create the vias of the substrate footprint, keeping an aspectratio of less than 14:1 for substrates as thick as 0.250 inch.

Another implementation of an optimized in-row-differential substratefootprint is illustrated in FIGS. 28 c and 28 d. In contrast to thesubstrate footprint of FIGS. 28 a and 28 b, adjacent columns of in thesubstrate footprint are offset from each other in order to minimizenoise. Similar to the substrate footprint described above, thissubstrate footprint is oriented “in-row” so as to reduce or eliminaterouting skew and connector skew; provides improved performance byproviding multiple points of contact 165 for connector grounds shieldsto the printed circuit board around points of contact 167 for signalpins or electrical contacts; and provides the ability to route alldifferential pairs out of an 8-row footprint in only four layers whileminimizing intra-layer, inter-layer, and trace-to-barrel routing noise.

The substrate footprint minimizes pair-to-pair crosstalk in that thetotal synchronous, multi-aggressor, worst-case crosstalk from a 20 ps(20-80%) edge is approximately 0.34% (far end noise). In someimplementations, at 52.1 pairs of vias per inch, the substrate footprintprovides an impedance of approximately 95 Ohms. In some implementations,a 13 mil diameter drill may be used to create the vias of the substratefootprint, keeping aspect ratio of less than 12:1 for substrates asthick as 0.150 inch.

It will be appreciated that while the footprints of FIGS. 27 a, 27 b, 27c, and 27 d have been described with respect to the high-speed connectorsystems described in the present application, these same footprintscould be used with other modules that connect to substrates such asprinted circuit boards.

Referring to FIGS. 29 a and 29 b, in some implementations, to improvemating alignment between the wafer housing 104 and the header module136, the header module 136 may include a guidance post 164 and the waferhousing 104 may include a guidance cavity 166 that receives the guidancepost 164 when the wafer housing 104 mates with the header module 136.Generally, the guidance post 164 and corresponding guidance cavity 166engage to provide initial positioning before the wafer housing 104 mateswith the header module 136.

Further, in some implementations, the header module 136 may additionallyinclude a mating key 168 and the wafer housing 104 may include acomplementary keyhole cavity 170 that receives the mating key 168 whenthe wafer housing 104 mates with the header module 136. Typically, themating key 168 and complementary keyhole cavity 170 may be rotated toset the complementary keys at different positions. Wafer housings 104and header modules 136 may include the mating key 168 and complementarykeyhole cavity 170 to control which wafer housing 104 mates with whichheader module 136.

Referring to the mounting end 170 of the plurality of wafer assemblies102, as shown in the FIG. 30 a, electrical contact mounting pins 172 ofthe first and second arrays of electrical contacts 110, 112 extend fromthe wafer assemblies 102. A plurality of tie bars 174 is additionallypositioned at the mounting end 170 of the plurality of wafer assemblies102.

Each tie bar 176, shown in detail in FIG. 31 a, includes a plurality ofsubstrate engagement elements 178, such as ground mounting pins, and aplurality of pairs of engagement tabs 180. Each tie bar 174 ispositioned across the plurality of wafer assemblies 102 so that the tiebar 174 engages each wafer assembly. Specifically, as shown in FIG. 31b, each pair of engagement tabs 180 engages a different wafer assembly106 with a first tab 182 of a pair of engagement tabs 174 positioned onone side of the center frame 108 and a second tab 184 of the pair ofengagement tabs 174 positioned on the other side of the center frame108.

The electrical contact mounting pins 172 extend from the plurality ofwafer assemblies 102, and the ground mounting pins 178 extend from theplurality of tie bars 174, to engage a substrate such as a backplanecircuit board or a daughtercard circuit board, as known in the art. Asdiscussed above, each electrical contact mounting pin 172 and eachground mounting pin may define a broadside 161 and an edge 163 that issmaller than the broadside 161.

In some implementations, each pair of electrical contact mounting pins172 corresponding to an electrical contact pair 130 is positioned in oneof two orientations, such as broadside coupled or edge coupled. In otherimplementations, each pair of electrical contact mounting pins 172corresponding to an electrical contact pair 130 is positioned in one oftwo orientations, wherein in a first orientation, a pair of electricalcontact mounting pins 172 is aligned so that the broadsides 161 of thepins are substantially parallel to a substrate, and in a secondorientation, a pair of electrical contact mounting pins 172 are alignedso that the broadsides 161 are substantially perpendicular to thesubstrate.

The electrical contact mounting pins 172 and the ground mounting pins178 may additionally be positioned at the mounting end 170 of theplurality of wafer assemblies 102 as shown in FIG. 29 to create anoise-canceling footprint. Similar to the noise-canceling footprintdiscussed above with the respect to the header module 136, in thenoise-cancelling footprint at the mounting end 170 of the plurality ofwafer assemblies 102, an orientation of a pair of electrical contactmounting pins 182 is offset from an orientation of each adjacent pair ofelectrical contact mounting pins 184 that is not separated from the pairof electrical contact mounting pins 182 by a ground mounting pin 186.

FIGS. 32 a, 32 b, 32 c, and 32 d are graphs illustrating an approximateperformance of the electrical connector system described above withrespect to FIGS. 2-31. FIG. 32 a is a performance plot illustratinginsertion loss vs. frequency for the electrical connector system; FIG.32 b is a performance plot illustrating return loss vs. frequency forthe electrical connector system; FIG. 32 c is a performance plotillustrating near-end crosstalk noise vs. frequency for the electricalconnector system; FIG. 32 d is a performance plot illustrating far-endcrosstalk noise vs. frequency for the electrical connector system. Asshown in FIGS. 32 a, 32 b, 32 c, and 32 d, the electrical connectorsystem provides a substantially uniform impedance profile to electricalsignals carried on the electrical contacts of the first and secondarrays of electrical contacts 110, 112 operating at speeds of up to atleast 25 Gbps.

Another implementation of a high-speed backplane connector system 200 isdescribed with respect to FIGS. 33-40. Similar to the connector system100 described above with respect to FIGS. 2-32, the high-speed backplaneconnector 200 includes a plurality of wafer assemblies 202 that arepositioned adjacent to one another within the connector system 200 by awafer housing 204.

Each wafer assembly 206 of the plurality of wafer assemblies 202includes a center frame 208, a first array of electrical contacts 210, asecond array of electrical contacts 212, a first ground shield leadframe 214, and a second ground shield lead frame 216. In someimplementations, the center frame 208 may comprise a liquid crystalpolymer (LCP); the first and second arrays of electrical contacts 210,212 may comprise phosphor bronze and gold (Au) or tin (Sn) over nickel(Ni) plating; and the first and second ground shield lead frames 214,216 may comprise brass or phosphor bronze and gold (Au) or tin (Sn) overnickel (Ni) plating. However, in other implementations, the center frame208 may comprise other polymers; the first and second arrays ofelectrical contacts 210, 212 may comprise other electrical conductivebase materials and platings (noble or non-noble); and the first andsecond ground shield lead frames 214, 216 may comprise other electricalconductive base materials and platings (noble or non-noble).

As shown in FIGS. 34, 35 a and 35 b, the center frame 208 defines afirst side 218 and a second side 220 opposing the first side 218. Thefirst side 218 comprises a conductive surface that defines a pluralityof first electrical contact channels 222 and a plurality of first groundshield channels 224. The second side 220 also comprises a conductivesurface that defines a plurality of second electrical contact channels226 and a plurality of second ground shield channels 228.

In some implementations, the first side 218 of the center frame 208 mayadditionally define a plurality of mating ridges (not shown) and aplurality of mating recesses (not shown), and the second side 220 of thecenter frame 208 may additionally define a plurality of mating ridges(not shown) and a plurality of mating recesses (not shown), as discussedabove with respect to FIGS. 17 a and 17 b. Typically at least one matingridge and mating recess is positioned between two adjacent electricalcontact channels of the plurality of first electrical contact channels222 and at least one mating ridge and mating recess is positionedbetween two adjacent electric contact channels of the plurality ofsecond electrical contact channels 226.

When each wafer assembly 206 is assembled, the first array of electricalcontacts 210 is positioned substantially within the plurality of firstelectrical contact channels 222 of the first side 218 and the secondarray of electrical contacts 212 is positioned substantially within theplurality of second electrical contact channels 226 of the second side220. In some implementations, the electrical contact channels 222, 226are lined with an insulation layer to electrically isolate theelectrical contacts 210, 212 positioned in the electrical contactchannels 222, 226.

When positioned within the electrical contact channels, each electricalcontact of the first array of electrical contacts 210 is positionedadjacent to an electrical contact of the second array of electricalcontacts 212. In some implementations, the first and second arrays ofelectrical contacts 210, 212 are positioned in the plurality of channels222, 226 such that a distance between adjacent electrical contacts issubstantially the same throughout the wafer assembly 206. Together, theadjacent electrical contacts of the first and second arrays ofelectrical contacts 210, 212 form an electrical contact pair 230. Insome implementations, the electrical contact pair 230 is an electricaldifferential pair.

As shown in FIG. 34, each electrical contact of the first and secondarrays of electrical contacts 210, 212 defines an electrical matingconnector 231 that extends away from a mating end 234 of the waferassembly 206 when the first and second arrays of electrical contacts210, 212 are positioned substantially within the electrical contactchannels 222, 226. In some implementations, the electrical matingconnectors 231 are closed-band shaped as shown in FIG. 8, where in otherimplementations, the electrical mating connectors 231 are tri-beamshaped as shown in FIG. 9 a or dual-beam shaped as shown in FIG. 9 b.Other mating connector styles could have a multiplicity of beams.

When each wafer assembly 206 is assembled, the first ground shield leadframe 214 is positioned substantially within the plurality of firstground shield channels 224 of the first side 218 and the second groundshield lead frame 216 is positioned substantially within the pluralityof second ground shield channels 228 of the second side 220. Each groundshield lead frame of the first and second ground shield lead frames 214,216 defines a ground mating tab 232 that extends away from the matingend 234 of the wafer assembly 206 when the ground shield lead frames214, 216 are positioned substantially within the ground shield channels224, 228. As shown in FIG. 36, one of the ground shield lead frames 214,216 is typically positioned above and below each pair of electricalmating connectors 231 associated with an electrical contact pair 230.

The wafer housing 204 receives the electrical mating connectors 231 andground tabs 232 extending from the mating end 234 of the plurality ofwafer assemblies 202, and positions each wafer assembly 206 adjacent toanother wafer assembly of the plurality of wafer assemblies 202. Asshown in FIG. 38, when positioned adjacent to one another, two waferassemblies 206 define a plurality of air gaps 235 substantially betweena length of an electrical contact of one wafer assembly and a length ofan electrical contact of the other wafer assembly. As discussed above,the air gaps 235 electrically isolate the electrical contacts positionedwithin the air gaps.

Referring to FIGS. 39 a, 39 b, 39 c, and 39 d, in some implementations,the wafer housing 204 defines a space 233 between a mating face of thewafer housing 204 and the center frame 208. The space 233 creates an airgap that electrically isolates at least the electrical mating connectors231 of the first and second array of electrical contacts 210, 212. Itwill be appreciated that any of the wafer housings described in thepresent application may utilize an air gap between a mating face of thewafer housing and the center frames of a plurality of wafer assembliesto electrically isolate electrical mating connectors extending from theplurality of wafer assemblies into the wafer housing.

A header module 236 of the connector system 200, such as the headermodule 136 described above with respect to FIGS. 18-28, is adapted tomate with the wafer housing 204 and plurality of wafer assemblies 202.As shown in FIGS. 39 a, 39 b, 39 c, and 39 d, as the header module 236receives the wafer housing 204, the wafer housing 204 receives aplurality of signal pin pairs 242, a plurality of C-shaped groundshields 238, and a row of ground tabs 240 extending from a mating faceof the header module 236. As the plurality of signal pin pairs 242 arereceived by the wafer housing 204, the signal pin pairs 242 engage theelectrical mating connectors 231 extending from the first and secondarrays of electrical contacts 210, 212. Additionally, as the pluralityof C-shaped ground shields 238 and row of ground tabs 240 are receivedby the wafer housing 204, the C-shaped ground shields 238 and groundtabs 240 engage the ground tabs 232 extending from the plurality ofwafer assemblies 202.

As shown in FIG. 39 b, the signal pin pairs 242 engage the electricalmating connectors 231 and the plurality of C-shaped ground shields 238and row of ground tabs 240 engage the ground tabs 232 in the air gap 233of the wafer housing 204. Accordingly, the air gap 233 electricallyisolates the electrical mating connectors 231 of the first and secondarray of electrical contacts 210, 212; the ground tabs 232 extendingfrom the plurality of wafer assemblies 202; and the C-shaped groundshields 238, ground tabs 240, and signal pin pairs extending from theheader module 236.

Referring to a mounting end 264 of the plurality of wafer assemblies202, each electrical contact of the first and second arrays ofelectrical contacts 210, 212 defines a substrate engagement element 266,such as an electrical contact mounting pin, that extends away from themounting end 264 of the plurality of wafer assemblies 202. Additionally,each ground shield of the first and second ground shield lead frames214, 216 define one or more substrate engagement elements 272, such asground contact mounting pins, that extend away from the mounting end 264of the plurality of wafer assemblies 202. As discussed above, in someimplementations, each electrical contact mounting pin 266 and groundcontact mounting pin 272 defines a broadside and an edge that is smallerthan the broadside. The electrical contact mounting pins 266 and groundcontact mounting pins 272 extend away from the mounting end 264 toengage a substrate, such as a backplane circuit board or a daughtercardcircuit board.

In some implementations, each pair of electrical contact mounting pins266 corresponding to an electrical contact pair 230 is positioned in oneof two orientations, such as broadside coupled or edge coupled. In otherimplementations, each pair of electrical contact mounting pins 266corresponding to an electrical contact pair 230 is positioned in one oftwo orientations, where in a first orientation, a pair of electricalcontact mounting pins 266 is aligned so that the broadsides of the pinsare substantially parallel to a substrate, and in a second orientation,a pair of electrical contact mounting pins 266 are aligned so that thebroadsides are substantially perpendicular to the substrate. Further,the electrical contact mounting pins 266 and the ground mounting pins272 may be positioned at the mounting end 264 of the plurality of waferassemblies 102 to create a noise-canceling footprint, as discussed abovewith respect to FIGS. 26 and 27.

FIGS. 40 a, 40 b, 40 c, and 40 d are graphs illustrating an approximateperformance of the electrical connector system described above withrespect to FIGS. 33-39. FIG. 40 a is a performance plot illustratinginsertion loss vs. frequency for the electrical connector system; FIG.40 b is a performance plot illustrating return loss vs. frequency forthe electrical connector system; FIG. 40 c is a performance plotillustrating near-end crosstalk noise vs. frequency for the electricalconnector system; and FIG. 40 d is a performance plot illustratingfar-end crosstalk noise vs. frequency for the electrical connectorsystem. As shown in FIGS. 40 a, 40 b, 40 c, and 40 d, the electricalconnector system provides a substantially uniform impedance profile toelectrical signals carried on the electrical contacts of the first andsecond arrays of electrical contacts 210, 212 operating at speeds of upto at least 25 Gbps.

Another implementation of a high-speed backplane connector system 300 isdescribed with respect to FIGS. 41-54. Similar to the connector systems100, 200 described above with respect to FIGS. 2-40, the high-speedbackplane connector 300 includes a plurality of wafer assemblies 302that are positioned adjacent to one another within the connector system300 by a wafer housing 304. Each wafer assembly 306 of the plurality ofwafer assemblies 302 includes a first housing 308, a first array ofovermolded electrical contacts 310, a second array of overmoldedelectrical contacts 312, and a second housing 314.

In some implementations, the first and second housings 308, 314 maycomprise a liquid crystal polymer (LCP) and the first and second arraysof electrical contacts 310, 312 may comprise phosphor bronze and gold(Au) or tin (Sn) over nickel (Ni) plating. However in otherimplementations, the first and second housings 308, 314 may compriseother polymers or tin (Sn), zinc (Zn), or aluminum (Al) with platingssuch as copper (Cu), and the first and second arrays of electricalcontacts 310, 312 may comprise other electrical conductive basematerials and platings (noble or non-noble).

As shown in FIGS. 41, 43, and 44 a, in some implementations, the secondhousing 314 comprises an embedded ground frame 316 at a side of thesecond housing 324 that defines a plurality of substrate engagementelements 318, such as ground mounting pins, and a plurality of groundmating tabs 320. The ground mounting pins 318 extend away from amounting end 364 of the wafer assembly 306 and the ground mating tabs320 extend away from a mating end 332 of the wafer assembly 306. Howeverin other implementations, as shown in FIGS. 42, 44 b, and 44 c, theground frame 316 is positioned at a side of the second housing 314 andis not embedded in the second housing 314. In some implementations, theground frame 316 may comprise a brass base material with tin (Sn) ornickel (Ni) plating. However, in other implementations, the ground frame316 may comprise other electrical conductive base materials and platings(noble or non-noble).

Each electrical contact of the first and second arrays of electricalcontacts 310, 312 defines a substrate engagement element 322, such as anelectrical contact mounting pin; a lead 324 that may be at leastpartially surrounded by an insulating overmold 325; and an electricalmating connector 327. In some implementations, the electrical matingconnectors 327 are closed-band shaped as shown in FIG. 8, where in otherimplementations, the electrical mating connectors 327 are tri-beamshaped as shown in FIG. 9 a or dual-beam shaped as shown in FIG. 9 b.Other mating connector styles could have a multiplicity of beams.

The first housing 308 comprises a conductive surface that defines aplurality of first electrical contact channels 328 and the secondhousing 314 comprises a conductive surface that defines a plurality ofsecond electrical contact channels 329. In some implementations, thefirst housing 308 may additionally define a plurality of mating ridges(not shown) and a plurality of mating recesses (not shown), and secondhousing 314 may additionally define a plurality of mating ridges (notshown) and a plurality of mating recesses (not shown), as discussedabove with respect to FIGS. 17 a and 17 b. Typically at least one matingridge and mating recess is positioned between two adjacent electricalcontact channels of the plurality of first electrical contact channels328 and at least one mating ridge and mating recess is positionedbetween two adjacent electric contact channels of the plurality ofsecond electrical contact channels 329.

When the wafer assembly 306 is assembled, the first array of electricalcontacts 310 is positioned within the plurality of first electricalcontact channels 328; the second array of electrical contacts 312 ispositioned within the plurality of second electrical contact channels329; and the first housing 308 mates with the second housing 314 to formthe wafer assembly 306. Further, in implementations including matingridges and mating recesses, the mating ridges of the first housing 308engage and mate with the complementary mating recesses of the secondhousing 314 and the mating ridges of the second housing 314 mate withthe complementary mating recesses of the first housing 308.

In implementations where at least a portion of the first array ofelectrical contacts 310 is surrounded by an insulating overmold 325, theinsulating overmold 325 associated with the first array of electricalcontacts 310 is additionally positioned in the plurality of firstelectrical contact channels 328. Similarly, in implementations where atleast a portion of the second array of electrical contacts 312 issurrounded by an insulating overmold 325, the insulating overmold 325associated with the second array of electrical contacts 310 isadditionally positioned in the plurality of second electrical contactchannels 329. The insulating overmolds 325 serve to electrically isolatethe electrical contacts of the first and second array of electricalcontacts 310, 312 from the conductive surfaces of the first and secondhousings 308, 314.

Referring to FIG. 45, in some implementations, each insulating overmold325 defines a recess 331 such that when the insulating overmold ispositioned in an electrical contact channel 328, 329, an air gap 333 isformed between the recess 331 of the insulating overmold 325 and a wallof the electrical contact channel 328, 329. The electrical contacts ofthe first and second arrays of electrical contacts 310, 312 are thenpositioned in the air gap 333 to electrically isolate the electricalcontacts from the conductive surfaces of the electrical contact channels328, 329.

Referring to FIG. 46, when positioned within the first and secondelectrical contact channels 328, 329, each electrical contact of thefirst array of electrical contacts 310 is positioned adjacent to anelectrical contact of the second array of electrical contacts 312. Insome implementations, the first and second arrays of electrical contacts310, 312 are positioned in the electrical contact channels 328, 329 suchthat a distance between adjacent electrical contacts is substantiallythe same throughout the wafer assembly 306. Together, the adjacentelectrical contacts form an electrical contact pair 330, which in someimplementations is also a differential pair. Typically, one of theground mating tabs 320 is positioned above and below the electricalmating connectors 327 associated with each electrical contact pair 330.

Referring to FIGS. 47 a, 47 b, 47 c, and 47 d in some implementationseach ground mating tab 320 of the ground frame 316 includes at least afirst mating rib 321 and a second mating rib 323. When the waferassembly 306 is assembled, each ground mating 320 extends across anelectrical contact pair 330, the first mating rib 321 contacts the firsthousing 308 and the second mating rib 323 contacts the second housing314. Due to the contact between the first housing 308, second housing314, and ground frame 316, the first housing 308, second housing 314,and ground frame 316 are electrically commoned to each other.

Referring to FIGS. 48 a and 48 b, the wafer housing 304 receives theelectrical mating connectors 327 and ground tabs 320 extending from themating end 332 of the wafer assemblies 302 and positions each waferassembly 306 adjacent to another wafer assembly 306 of the plurality ofwafer assemblies 302. As shown in FIG. 49, in some implementations thewafer housing 304 positions two wafer assemblies 306 adjacent to eachother such that an air gap 307 exists between the two adjacent waferassemblies 306. The air gap 307 assists in creating a continuousreference structure including at least the first housing 308, secondhousing 314, and ground frame 316 of each wafer assembly 306. In someimplementations, a distance between two adjacent wafer assemblies 306(the air gap 307) may be greater than zero but less than or equal tosubstantially 0.5 mm.

Referring to FIGS. 48 a and 48 b, the connector system 300 includes aheader module 336, such as the header modules 136, 236 described above,adapted to mate with the wafer housing 304 and plurality of waferassemblies 302. As shown in FIGS. 48 and 50, as the header module 336mates with the wafer housing 304, the wafer housing 304 receives aplurality of signal pin pairs 342, a plurality of C-shaped groundshields 338, and a row of ground tabs 340 extending from a mating faceof the header module 336. As the plurality of signal pin pairs 342 arereceived by the wafer housing 304, the signal pin pairs 342 engage theelectrical mating connectors 327 extending from the first and secondarrays of electrical contacts 310, 312. Additionally, as the pluralityof C-shaped ground shields 338 and row of ground tabs 340 are receivedby the wafer housing 304, the C-shaped ground shields 338 and groundtabs 340 engage the ground tabs 320 extending from the plurality ofwafer assemblies 202.

Referring to FIGS. 51-53, in some implementations, the connector system300 includes one or more organizers. In one implementation, as shown inFIGS. 51 a and 51 b, an organizer 367 is positioned along a backside ofthe plurality of wafer assemblies 302 to lock the plurality of waferassemblies 302 together. In some implementations, the organizer 367 maycomprise a brass base material with tin (Sn) over nickel (Ni) plating.However, in other implementations, the organizer 367 may be stamped ormolded from any thin material that is mechanically stiff.

In other implementations, as shown in FIGS. 52 a, 52 b, and 52 c, anorganizer 366 is positioned at the mounting end 364 of the plurality ofwafer assemblies 302. Typically, the organizer 366 comprises columns ofovermolded plastic insulators 368 positioned on an etched metal plate370. In some implementations, the insulator 368 may comprise a liquidcrystal polymer (LCP) and the metal plate may comprise a brass orphosphor bronze base with tin (Sn) over nickel (Ni) plating. However, inother implementations, the insulator 368 may comprise other polymers andthe metal plate may comprise other electrically conductive basematerials and platings (noble or non-noble).

The plastic insulators 368 and metal plate 370 include complementaryapertures 372 dimensioned to allow the electrical contact mounting pins322 of the first and second array of electrical contacts 310, 312 toextend through the organizer 366 and away from the wafer assemblies 302as shown in FIG. 51 to engage a substrate such as a backplane circuitboard or a daughtercard circuit board. Similarly, the metal plate 370includes apertures 372 dimensioned to allow the mounting pins 318 of theground frames 316 to extend through the organizer 366 and away from thewafer assemblies 302, as shown in FIGS. 52 b and 52 c, to engage asubstrate such as a backplane circuit board or a daughtercard circuitboard.

Yet another implementation of an organizer 366 positioned at themounting end 364 of the plurality of wafer assemblies 302 is illustratedin FIGS. 53 a, 53 b, 53 c, and 53 d. In this implementation, in additionto apertures 372 that allow the electrical contact mounting pins 322 ofthe first and second arrays of electrical contacts 310, 312 to extendthrough the organizer 366 and away from the wafer assemblies 302, andapertures 374 that allow the mounting pins 318 of the ground frames 316to extend through the organizer 366 and away from the wafer assemblies302, the organizer 366 additionally includes a plurality of apertures375 that allow projections 376 extending from the first and/or secondhousings 308, 314 to pass through the organizer 366. When the pluralityof wafer assemblies 302 is mounted to a substrate, such as a printedcircuit board, the projections 376 extend through the organizer 366 andcontact the substrate. By extending projections 376 from the first orsecond housings 308, 314 to the substrate, the projections 376 mayprovide shielding to the electrical contact mounting pins 322 of thefirst and second arrays of electrical contacts 310, 312 as they passthrough the organizer 366.

In some implementations, the projections 376 extending from the firstand/or second housings 308, 314 are flush with the organizer 366 asshown in FIG. 53 a so that when the plurality of wafer assemblies 302 ismounted to the substrate, both the projections 376 and the organizer 366contact the substrate. However in other implementations, as shown inFIGS. 53 b, 53 c, and 53 d, the projections 376 extending from the firstand/or second housings 308, 314 extend away from the organizer 366.Because the projections 376 extend away from the organizer 366, when theplurality of wafer assemblies 302 is mounted to a substrate, an air gap378 is created between the organizer 366 and the substrate that assistsin electrically isolating electrical contact mounting pins 322 of thefirst and second arrays of electrical contacts 310, 312 extending awayfrom the organizer 366. The air gap 378 additionally assists in creatinga continuous references structure including at least the first waferhousing 308, second wafer housing 314, and ground shield 316 of eachwafer assembly 306. In some implementations, a distance between theorganizer 366 and the substrate (the air gap 378) may be greater thanzero but less than or equal to substantially 0.5 mm.

In some implementations, each pair of electrical contact mounting pins332 corresponding to an electrical contact pair 330 is positioned in oneof two orientations, such as broadside coupled or edge coupled. In otherimplementations, each pair of electrical contact mounting pins 332corresponding to an electrical contact pair 330 is positioned in one oftwo orientations, where in a first orientation, a pair of electricalcontact mounting pins 332 is aligned so that the broadsides of the pinsare substantially parallel to a substrate, and in a second orientation,a pair of electrical contact mounting pins 332 are aligned so that thebroadsides are substantially perpendicular to the substrate. Further,the electrical contact mounting pins 332 and the ground mounting pins318 may be positioned at the mounting end 364 of the plurality of waferassemblies 332 to create a noise-canceling footprint, as discussed abovewith respect to FIGS. 26, 27, and 28.

FIGS. 54 a, 54 b, 54 c, and 54 d are graphs illustrating an approximateperformance of the electrical connector system described above withrespect to FIGS. 41-53. FIG. 54 a is a performance plot illustratinginsertion loss vs. frequency for the electrical connector system; FIG.54 b is a performance plot illustrating return loss vs. frequency forthe electrical connector system; FIG. 54 c is a performance plotillustrating near-end crosstalk noise vs. frequency for the electricalconnector system; and FIG. 54 d is a performance plot illustratingfar-end crosstalk noise vs. frequency for the electrical connectorsystem. As shown in FIGS. 54 a, 54 b, 54 c, and 54 d, the electricalconnector system provides a substantially uniform impedance profile toelectrical signals carried on the electrical contacts of the first andsecond arrays of electrical contacts 310, 312 operating at speeds of upto at least 25 Gbps.

Yet another implementation of a high-speed backplane connector system400 is described with respect to FIGS. 55-63. Generally, the connectorsystem 400 includes a ground shield 402, a plurality of housing segments404, and a plurality of electrical contact assemblies 406. In someimplementations, the ground shield 402 may comprise a liquid crystalpolymer, tin (Sn) plating and copper (Cu) plating. However, in otherimplementations, the ground shield 402 may comprise other materials suchas zinc (Zn), aluminum (Al), or a conductive polymer.

Referring to FIGS. 57 a and 57 b, each electrical contact assembly 408of the plurality of electrical contact assemblies 406 includes aplurality of electrical contacts 410 and a plurality of substantiallyrigid insulated sections 412. In some implementations, the electricalcontacts 410 may comprise a phosphor bronze base material and goldplating and tin plating over nickel plating, and the insulating sections412 may comprise a liquid crystal polymer (LCP). However, in otherimplementations, the electrical contacts 410 may comprise otherelectrically conductive base materials and platings (noble or non-noble)and the insulating sections 412 may comprise other polymers.

Each electrical contact of the plurality of electrical contacts 410defines a length direction 414 with one or more substrate engagementelements 415, such as electrical contact mounting pins, at a mountingend 426 of the electrical contact and defines an electrical matingconnector 417 at a mating end 422 of the electrical contact. In someimplementations, the electrical mating connectors 417 are closed-bandshaped as shown in FIG. 8, where in other implementations, theelectrical mating connectors 417 are tri-beam shaped as shown in FIG. 9a or dual-beam shaped as shown in FIG. 9 b. Other mating connectorstyles could have a multiplicity of beams.

The electrical contacts 410 are positioned within the electrical contactassembly 408 such that each electrical contact is substantially parallelto the other electrical contacts. Typically, two electrical contacts ofthe plurality of electrical contacts 410 form an electrical contact pair430, which in some implementations may be a differential pair.

The plurality of insulated sections 412 is positioned along the lengthdirection of the plurality of electrical contacts 410 to position theelectrical contacts 410 in the substantially parallel relationship. Theplurality of insulated sections 412 are spaced apart from one anotheralong the length of the plurality of electrical contacts 410. Due to thespaces 416 between the insulated sections, the electrical contactassembly 408 may be bent between the insulated sections 412, as shown inFIG. 55 b, while still maintaining the substantially parallelrelationship between the electrical contacts of the plurality ofelectrical contacts 410. Parallel contact pairs could be positioned in ahelical configuration (like twisted pairs of wires) within eachinsulated section, and oriented favorably for bending at the spacesbetween insulated sections.

Each housing segment of the plurality of housing segments 404 defines aplurality of electrical contact channels 418. The electric contactchannels 418 may comprise a conductive surface to create a conductivepathway. Each electric contact channel 418 is adapted to receive one ofthe electrical contact assemblies 408 and to electrically isolate theelectrical contacts 410 of the electrical contact assembly positionedwithin the electric contact channel from the conductive surfaces of theelectric contact channel and from electrical contacts 410 positioned inother electric contact channels.

As shown in FIGS. 56 a and 56 c, the ground shield 402 defines aplurality of segment channels 425, each of which is adapted to receive ahousing segment of the plurality of housing segments 404. The groundshield 402 positions the plurality of housing segments 404 as shown inFIG. 55 so that the electrical mating connectors 417 of the electricalcontact assemblies 406 extending from the housing segments 404 form amatrix of rows and columns. It should be appreciated that each housingsegment of the plurality of housing segments 404 and associatedelectrical contact assemblies 406 form a row of the matrix so that whenthe plurality of housing segments 404 are positioned adjacent to oneanother as shown in FIG. 54 b, the matrix is formed.

The ground shield 402 defines a plurality of ground mating tabs 420extending from a mating end 422 of the ground shield 402 and defines aplurality of substrate engagement elements 424, such as ground mountingpins, extending from a mounting end 426 of the ground shield 402. Theground mounting pins may define a broadside and an edge that is smallerthan the broadside.

In some implementations, each pair of electrical contact mounting pins415 corresponding to an electrical contact pair 430 is positioned in oneof two orientations, such as broadside coupled or edge coupled. In otherimplementations, each pair of electrical contact mounting pins 415corresponding to an electrical contact pair 430 is positioned in one oftwo orientations, wherein in a first orientation, a pair of electricalcontact mounting pins 415 is aligned so that the broadsides of the pinsare substantially parallel to a substrate, and in a second orientation,a pair of electrical contact mounting pins 415 are aligned so that thebroadsides are substantially perpendicular to the substrate. Othermounting pin orientations from 0 degrees to 90 degrees between broadsideand edge are possible. Further, the electrical contact mounting pins 415and the ground mounting pins 424 may be positioned to create anoise-canceling footprint, as discussed above with respect to FIGS. 26,27, and 28.

The connector system 400 may include a mounting-end organizer 428 and/ora mating-end organizer 432. In some implementations the mounting-end andmating-end organizers 428, 432 may comprise a liquid crystal polymer(LCP). However, in other implementations, the mounting-end andmating-end organizers 428, 432 may comprise other polymers. Themounting-end organizer 428 defines a plurality of apertures 434 so thatwhen the mounting-end organizer 428 is positioned at the mounting end426 of the ground shield 402, the ground mounting pins 424 extendingfrom the ground shield 402 and the electrical contact mounting pins 415extending from the plurality of electrical contact assemblies 406 passthrough the plurality of apertures 434, and extend away from themounting-end organizer 428 to engage one of a backplane circuit board ora daughtercard circuit board, as explained above.

Similarly, the mating-end organizer 432 defines a plurality of apertures435 so that when the mating-end organizer 432 is positioned at themating end 426 of the ground shield 402, the ground mating tabs 420extending from the ground shield 402 and the electrical matingconnectors 417 extending from the plurality of electrical contactassemblies 406 pass through the plurality of apertures 434, and extendaway from the mating-end organizer 432.

Referring to FIG. 62, the connector system 400 includes a header module436, such as the header modules 136, 236, 336 described above, adaptedto receive the ground mating tabs 420 and electrical mating connectors417 extending away from the mating-end organizer 432. As the headermodule 436 receives the electrical mating connectors 417, a plurality ofsignal pin pairs 442 extending from a mating face of header module 436engages the electrical mating connectors 417. Similarly, as the headermodule 436 receives the ground mating tabs 420, a plurality of C-shapedground shields 438 and row of ground tabs 440 extending from the matingface of the header module 436 engage the ground mating tabs 420.

FIGS. 63 a, 63 b, 63 c, and 63 d are graphs illustrating an approximateperformance of the electrical connector system described above withrespect to FIGS. 55-62. FIG. 63 a is a performance plot illustratinginsertion loss vs. frequency for the electrical connector system; FIG.63 b is a performance plot illustrating return loss vs. frequency forthe electrical connector system; FIG. 63 c is a performance plotillustrating near-end crosstalk noise vs. frequency for the electricalconnector system; and FIG. 63 d is a performance plot illustratingfar-end crosstalk noise vs. frequency for the electrical connectorsystem. As shown in FIGS. 63 a, 63 b, 63 c, and 63 d, the electricalconnector system provides a substantially uniform impedance profile toelectrical signals carried on the electrical contacts of the first andsecond arrays of electrical contacts 410 operating at speeds of up to atleast 25 Gbps.

Additional implementations of wafer assemblies used in a high-speedbackplane connector system is described below respect to FIGS. 64-71.Similar to the connector systems 100, 200, 300 described above withrespect to FIGS. 2-54, a high-speed backplane connector system mayincludes a plurality of wafer assemblies 502 that are positionedadjacent to one another within the connector system 500 by a waferhousing, as described above.

Referring to FIGS. 64 and 65, in one implementation, each wafer assembly505 of the plurality of wafer assemblies 502 includes a plurality ofelectrical signal contacts 506, a plurality of groundable electriccontacts 508, and a frame 510. The frame 510 defines a first side 512and a second side 514. The first side 512 further defines a plurality offirst channels 516, each of which comprises a conductive surface and isadapted to receive one or more electrical signal contacts of theplurality of electrical signal contacts 506. In some implementations,the plurality of electrical signal contacts 506 is positioned within asignal lead shell 518 that is sized to be received by the plurality offirst channels 516 as shown in FIG. 64. It will be appreciated that insome implementations, two electrical signal contacts of the plurality ofelectrical signal contacts 506 are positioned within the signal leadshell 518 to form an electrical contact pair 520, which may additionallybe a differential pair.

The second side 514 of the frame 510 may also define a plurality ofsecond channels 522. Each channel of the plurality of second channels522 includes a conductive surface and is adapted to receive one or moreelectrical signal contacts, as explained in more detail below.

The frame 510 further includes a plurality of apertures 524 extendinginto the conductive surface of the plurality of first channels 516. Insome implementations, the plurality of apertures 524 may also extendinto the conductive surface of the plurality of second channels 522.

As shown in FIG. 64, each aperture of the plurality of apertures 524 isspaced apart from another aperture of the plurality of apertures alongthe frame 510, and is positioned on the frame 510 between channels ofthe plurality of first channels 516. Each aperture of the plurality ofapertures 524 is adapted to receive a groundable electric contact of theplurality of groundable electric contacts 508. In some implementations,the plurality of groundable electric contacts 508 are electricallyconnected to the conductive surfaces of the first and second sides 512,514.

A wafer housing, such as the wafer housing described above 104, 204, and304, receives a mating end 526 of the plurality of wafer assemblies 502and positions each wafer assembly adjacent to another wafer assembly ofthe plurality of wafer assemblies 502. When positioned in the waferhousing 504, the signal lead shell 518 engaging the first side 514 ofthe frame 510 also engages the second side 514 of the frame 510 of anadjacent wafer assembly.

As shown in FIGS. 66 a, 66 b, and 67, the connector system 500 includesa header unit 536 adapted to mate with a wafer housing and the pluralityof wafer assemblies 502. When the header unit 536 mates with the waferhousing and plurality of wafer assemblies 502, the electrical signalcontacts 506 of the wafer assemblies 502 receive a plurality of signalpin pairs 542 extending from a mating face of the header module 536.Similarly, when the header unit 536 mates with the wafer housing andplurality of wafer assemblies 502, the groundable electric contacts 508receive a plurality of ground pins or ground shields 540 extending fromthe mating face of the header module 536.

Each signal pin of the signal pin pairs 542 defines a substrateengagement element such as a signal mounting pin 544 and each ground pin540 defines a substrate engagement element such as a ground mounting pin546. The signal pins 542 and ground pins 540 extend through the headerunit 536 so that the signal mounting pins 544 and ground mounting pins546 extend away from a mounting face of the header module 536 to engagea backplane circuit board or a daughtercard circuit board.

As described above, in some implementations, each pair of signalmounting pins 544 is positioned in one of two orientations, such asbroadside coupled or edge coupled. In other implementations, each pairof signal mounting pins 544 is positioned in one of two orientationswhere in a first orientation, a pair of signal mounting pins 544 arealigned so that broadsides of the pair are substantially parallel to asubstrate, and in a second orientation, a pair of signal mounting pins544 are aligned so that the broadsides of the pair are substantiallyperpendicular to the substrate. Further, the signal mounting pins 544and the ground mounting pins 546 may be positioned to create anoise-cancelling footprint, as described above with respect to FIGS. 26,27, and 28.

Referring to FIG. 68, in some implementations, electrical signalcontacts are not embedded in a signal lead shell 518, but are positionedwithin channels of the signal lead shell 518. For example, the signallead shell 518 may define a plurality of first channels 525 and aplurality of second channels 526. A first array of electrical contacts527 is positioned within the plurality of first channels 525 and asecond array of electrical contacts 528 is positioned within theplurality of second channels 526.

When positioned within the channels 525, 526, each electrical contact ofthe first array of electrical contacts 527 is positioned adjacent to anelectrical contact of the second array of electrical contacts 528.Together, the two electrical contacts form the electrical contact pair520, which may also be a differential pair.

When the signal lead shell 518 is positioned between a frame 510 of awafer assembly and a frame 510 of an adjacent wafer assembly, aplurality of air gaps 529 are formed between one of the channels 525,526 of the signal lead shell 518 and a frame 510 of a wafer assembly505. The air gaps 529 serve to electrically isolate the electricalcontact positioned in the air gap from the conductive surfaces of thechannels 525, 526.

Referring to FIGS. 69 and 70, in some implementations, each waferassembly 505 may include a locking assembly 532 to secure the pluralityof wafer assemblies 502 together. For example, as shown in FIG. 68, thelocking assembly 532 may be a fork that extends into an adjacent waferassembly 505 and mates with a frame 510 of the adjacent wafer assembly505. Alternatively, as shown in FIG. 69, the locking assembly 532 may bea wave spring that engages two adjacent wafer assemblies 505.

FIGS. 71 a, 71 b, 71 c, and 71 d are graphs illustrating an approximateperformance of the high-speed connector system utilizing the waferassemblies described above with respect to FIGS. 64-70. FIG. 71 a is aperformance plot illustrating insertion loss vs. frequency for thehigh-speed connector system; FIG. 71 b is a performance plotillustrating return loss vs. frequency for the high-speed connectorsystem; FIG. 71 c is a performance plot illustrating near-end crosstalknoise vs. frequency for the high-speed connector system; and FIG. 71 dis a performance plot illustrating far-end crosstalk noise vs. frequencyfor the high-speed connector system. As shown in FIGS. 71 a, 71 b, 71 c,and 71 d, the electrical connector system provides a substantiallyuniform impedance profile to electrical signals carried on theelectrical contacts 506 operating at speeds of up to at least 25 Gbps.

While various high-speed backplane connector systems have been describedwith reference to particular embodiments, it will be understood by thoseskilled in the art that various changes may be made and equivalents maybe substituted for elements thereof without departing from the scope ofthe invention. In addition, many modifications may be made to adapt aparticular situation or material to the teachings of the inventionwithout departing from the essential scope thereof. Therefore, it isintended that the invention not be limited to the particular embodimentdisclosed as the best mode contemplated for carrying out this invention,but that the invention will include all embodiments falling within thescope of the appended claims.

1. An electrical connector system for mounting a substrate, the systemcomprising: a plurality of wafer assemblies defining a mating end and amounting end, each of the wafer assemblies comprising: a first housingdefining a plurality of first electrical contact channels; a first arrayof electrical contacts positioned substantially within the plurality offirst electrical contact channels, each electrical contact of the firstarray of electrical contacts defining an electrical mating connectorextending past an edge of the first housing at the mating end of thewafer assembly; a second housing configured to mate with the firsthousing, the second housing defining a plurality of second electricalcontact channels; a second array of electrical contacts positionedsubstantially within the plurality of second electrical contactchannels, each electrical contact of the second array of electricalcontacts defining an electrical mating connector extending past an edgeof the second housing at the mating end of the wafer assembly; and aground frame positioned at a side of the second housing, the groundframe defining a plurality of ground mating tabs extending past the edgeof the second housing at the mating end of the wafer assembly; and awafer housing adapted to position the plurality of wafer assembliesadjacent to one another in the electrical connector system.
 2. Theelectrical connector system of claim 1, wherein the ground frame isembedded in the side of the second housing.
 3. The electrical connectorsystem of claim 1, wherein each electrical mating connector of the firstand second arrays of electrical contacts is closed-band shaped.
 4. Theelectrical connector system of claim 1, wherein each electrical matingconnector of the first and second arrays of electrical contacts istri-beam shaped.
 5. The electrical connector system of claim 1, whereineach electrical mating connector of the first and second arrays ofelectrical contacts is dual-beam shaped.
 6. The electrical connectorsystem of claim 1, wherein in each wafer assembly, at least a portion ofthe electrical contacts of the first array of electrical contacts ispartially surrounded by a first insulating overmold and at least aportion of the electrical contacts of the second array of electricalcontacts is partially surrounded by a second insulating overmold.
 7. Theelectrical connector system of claim 6, wherein in each wafer assembly,the first insulating overmold is substantially positioned in theplurality of first electrical contact channels; wherein in eachelectrical contact channel of the plurality of first electrical contactchannels, the first insulating overmold defines a recess that forms anair gap between the recess and a wall of the electrical contact channel;and wherein the first array of electrical contacts is positioned in theair gaps formed by the first insulating overmold and the plurality offirst electrical contact channels.
 8. The electrical connector system ofclaim 7, wherein in each wafer assembly, the second insulating overmoldis substantially positioned in the plurality of second electricalcontact channels; wherein in each electrical contact channel of theplurality of second electrical contact channels, the second insulatingovermold defines a recess that forms an air gap between the recess and awall of the electrical contact channel; and wherein the second array ofelectrical contact is positioned in the air gaps formed by the secondinsulting overmold and the plurality of second electrical contactchannels.
 9. The electrical connector system of claim 1, wherein foreach wafer assembly, each electrical contact of the first array ofelectrical contacts is positioned in the wafer assembly adjacent to anelectrical contact of the second array of electrical contacts to form aplurality of electrical contact pairs.
 10. The electrical connectorsystem of claim 9, wherein each electrical contact of the second arrayof electrical contacts mirrors an adjacent electrical contact of thefirst array of electrical contacts.
 11. The electrical connector systemof claim 9, wherein a distance between an electrical contact of thefirst array of electrical contacts and an adjacent electrical contact ofthe second array of electrical contacts is substantially the samethroughout a wafer assembly of the plurality of wafer assemblies. 12.The electrical connector system of claim 9, wherein each electricalcontact pair is a differential pair.
 13. The electrical connector systemof claim 9, wherein a ground mating tab of the plurality of groundmating tabs is positioned between two adjacent electrical contact pairsat the mating end of the wafer assembly.
 14. The electrical connectorsystem of claim 13, wherein at least one ground mating tab of theplurality of ground mating tabs spans an electrical contact pair of theplurality of electrical contact pairs.
 15. The electrical connectorsystem of claim 13, wherein at least one ground mating tab of theplurality of ground mating tabs electrically contacts the first housingand electrically contacts the second housing.
 16. The electricalconnector system of claim 1, wherein the first and second housingscomprise conductive plastic.
 17. The electrical connector system ofclaim 1, wherein the wafer assemblies of the electrical connector systemare sized and positioned such that the electrical connector system iscapable of providing a substantially uniform impedance profile toelectrical signals carried on the electrical contacts of the first andsecond arrays of electrical contacts at speeds of up to at least 25Gbps, and wherein the density of electrical contacts at a mating end ofthe plurality of wafer assemblies is greater than 100 electricalcontacts per inch.
 18. The electrical connector system of claim 1,further comprising: a header module adapted to mate with the waferhousing and plurality of wafer assemblies, the header module comprising:a plurality of C-shaped ground shields positioned on a mating face ofthe header module; and a plurality of signal pin pairs positioned on themating face of the header module; wherein each C-shaped ground shield ofthe plurality of C-shaped ground shields is positioned to substantiallysurround three sides of a signal pin pair of the plurality of signal pinpairs, wherein when the header module mates with the wafer housing andplurality of wafer assemblies, the plurality of signal pin pairs engagesthe electrical contacts of the first and second arrays of electricalcontacts of the plurality of wafer assemblies.
 19. The electricalconnector system of claim 18, wherein the header module furthercomprises: a plurality of ground tabs positioned on the mating face ofthe header module; wherein at least one signal pin pair of the pluralityof signal pin pairs is substantially surrounded by a C-shaped groundshield of the plurality of C-shaped ground shields and a ground tab ofthe plurality of ground tabs.
 20. The electrical connector system ofclaim 19, wherein when the header module mates with the wafer housingand the plurality of wafer assemblies, the plurality of C-shaped groundshields and the plurality of ground tabs of the header module engage theplurality of ground mating tabs of the plurality of wafer assemblies.21. The electrical connector system of claim 20, wherein when the headermodule mates with the wafer housing and the plurality of waferassemblies, each ground mating tab of the plurality of ground matingtabs of the plurality of wafer assemblies, each C-shaped ground shieldof the plurality of C-shaped ground shields of the header module, andeach ground tab of the plurality of ground tabs of the header modulespans an electrical contact of the first array of electrical contactsand an electrical contact of the second array of electrical contacts.22. The electrical connector system of claim 21, wherein when the headermodule mates with the wafer housing and the plurality of waferassemblies, each set of engaged signal pin pair and electrical contactsis electrically isolated from other sets of engaged signal pin pairs andelectrical contacts by a ground mating tab of the plurality of groundmating tabs of the wafer assemblies, a C-shaped ground shield of theplurality of C-shaped ground shields of the header module, and one of aground tab of the plurality of ground tabs of the header module or aside of another C-shaped ground shield of the plurality of C-shapedground shields of the header module.
 23. The electrical connector systemof claim 18, wherein for each signal pin pair of the plurality of signalpin pairs, a first signal pin of the signal pin pairs mirrors a secondsignal pin of the signal pin pair.
 24. The electrical connector systemof claim 18, wherein the header module defines a guidance post and thewafer housing defines a complementary guidance cavity.
 25. Theelectrical connector system of claim 18, wherein the header moduledefines a mating key and the wafer housing defines a complementarykeyhole.
 26. The electrical connector system of claim 18, wherein thesignal pins of the plurality of signal pin pairs are vertical roundedpins.
 27. The electrical connector system of claim 18, wherein thesignal pins of the plurality of signal pin pairs are vertical U-shapedpins.
 28. The electrical connector system of claim 18, wherein theplurality of C-shaped ground shields is positioned on the mating face ofthe header module such that each C-shaped ground shield is perpendicularto a wafer assembly of the plurality of wafer assemblies when the headermodule mates with the wafer housing and plurality of wafer assemblies.29. A wafer assembly comprising: a first housing defining a plurality offirst electrical contact channels; a first array of electrical contactspositioned substantially within the plurality of first electricalcontact channels, each electrical contact of the first array ofelectrical contacts defining an electrical mating connector extendingpast an edge of the first housing at a mating end of the wafer assembly;a first insulating overmold partially surrounding the first array ofelectrical contacts, the first insulating overmold positionedsubstantially within the plurality of first electrical contact channels;a second housing configured to mate with the first housing, the secondhousing defining a plurality of second electrical contact channels; asecond array of electrical contacts positioned substantially within theplurality of second electrical contact channels, each electrical contactof the second array of electrical contacts defining an electrical matingconnector extending past an edge of the second housing at the mating endof the wafer assembly; a second insulating overmold partiallysurrounding the second array of electrical contacts, the secondinsulating overmold positioned substantially within the plurality ofsecond electrical contact channels; and a ground frame positioned at aside of the second housing, the ground frame defining a plurality ofground mating tabs extending past the edge of the second housing at themating end of the wafer assembly.
 30. The wafer assembly of claim 29,wherein the ground frame is embedded in the side of the second housing.31. The wafer assembly of claim 29, wherein in each of the firstelectrical contact channels, the first insulating overmold defines arecess that forms an air gap between the recess and a wall of the firstelectrical contact channel; and wherein the first array of electricalcontacts is positioned in the air gaps formed by the first insulatingovermold and the plurality of first electrical contact channels.
 32. Thewafer assembly of claim 31, wherein in each of the second electricalcontact channels, the second insulating overmold defines a recess thatforms an air gap between the recess and a wall of the second electricalcontact channel; and wherein the second array of electrical contacts ispositioned in the air gaps formed by the second insulating overmold andthe plurality of second electrical contact channels.
 33. The waferassembly of claim 29, wherein each electrical contact of the first arrayof electrical contacts is positioned in the wafer assembly adjacent toan electrical contact of the second array of electrical contacts to formelectrical contact pairs.
 34. The wafer assembly of claim 33, whereinthe electrical contact pairs are differential pairs.
 35. The waferassembly of claim 29, wherein the first and second housings compriseconductive plastic.
 36. A wafer assembly comprising: a first housingdefining a plurality of first electrical contact channels, a firstplurality of mating ridges, and a first plurality of mating recesses,wherein at least one mating ridge of the first plurality of matingridges and at least one mating recess of the first plurality of matingrecesses are positioned between two adjacent electrical contact channelsof the plurality of first electrical contact channels; a first array ofelectrical contacts positioned substantially within the plurality offirst electrical contact channels; a second housing configured to matewith the first housing, the second housing defining a plurality ofsecond electrical contact channels, a second plurality of mating ridges,and a second plurality of mating recesses, wherein at least one matingridge of the second plurality of mating ridges and at least one matingrecess of the second plurality of mating recesses are positioned betweentwo adjacent electrical contact channels of the plurality of secondelectrical contact channels; a second array of electrical contactspositioned substantially within the plurality of second electricalcontact channels; wherein when the second housing mates with the firsthousing, the first plurality of mating ridges engage and mate with thesecond plurality of mating recesses and the second plurality of matingridges engage and mate with the first plurality of mating recesses. 37.An electrical connector system for mounting a substrate, the systemcomprising: a plurality of wafer assemblies positioned adjacent to oneanother in the electrical connector system, each wafer assemblycomprising: a first housing defining a plurality of first electricalcontact channels; a first array of electrical contacts positionedsubstantially within the plurality of first electrical contact channels;a second housing configured to mate with the first housing, the secondhousing defining a plurality of second electrical contact channels; asecond array of electrical contacts positioned substantially within theplurality of second electrical contact channels; wherein when the firsthousing mates with the second housing, the first and second housingsdefine a plurality of air gaps, at least one of the air gaps of theplurality of air gaps electrically isolating an electrical contact ofthe first array of electrical contacts and an electrical contact of thesecond array of electrical contacts; wherein the plurality of waferassemblies are sized and positioned in the electrical connector systemto provide a substantially uniform impedance profile to electricalsignals carried on the electrical contacts of the first and secondarrays of electrical contacts of the plurality of wafer assemblies atspeeds of up to at least 25 Gbps, and wherein a density of electricalcontacts at a mating end of the plurality of wafer assemblies is greaterthan 100 contacts per square inch.
 38. An electrical connector systemfor mounting a substrate, the system comprising: a plurality of waferassemblies, each wafer assembly comprising: a first housing defining aplurality of first electrical contact channels; a first array ofelectrical contacts positioned substantially within the plurality offirst electrical contact channels; a second housing configured to matewith the first housing, the second housing defining a plurality ofsecond electrical contact channels; a second array of electricalcontacts positioned substantially within the plurality of secondelectrical contact channels; a wafer housing that positioned theplurality of wafer assemblies such that the wafer assemblies are alignedand positioned adjacent to one another in the electrical connectorsystem; wherein the wafer housing defines an air gap between a matingface of the wafer housing and the first and second housings such thatthe air gap surrounds at least a mating end of first and second arraysof electrical contacts.